フォロー
Matthew J. Burch
Matthew J. Burch
3M
確認したメール アドレス: mmm.com
タイトル
引用先
引用先
Engineering the thermal conductivity along an individual silicon nanowire by selective helium ion irradiation
Y Zhao, D Liu, J Chen, L Zhu, A Belianinov, OS Ovchinnikova, RR Unocic, ...
Nature Communications 8 (1), 15919, 2017
842017
Relaxor ferroelectric behavior in barium strontium titanate
LM Garten, M Burch, AS Gupta, R Haislmaier, V Gopalan, EC Dickey, ...
Journal of the American Ceramic Society 99 (5), 1645-1650, 2016
472016
Data mining for better material synthesis: The case of pulsed laser deposition of complex oxides
SR Young, A Maksov, M Ziatdinov, Y Cao, M Burch, J Balachandran, L Li, ...
Journal of Applied Physics 123 (11), 2018
422018
Noble gas ion beams in materials science for future applications and devices
A Belianinov, MJ Burch, S Kim, S Tan, G Hlawacek, OS Ovchinnikova
Mrs Bulletin 42 (9), 660-666, 2017
332017
Chemical phenomena of atomic force microscopy scanning
AV Ievlev, C Brown, MJ Burch, JC Agar, GA Velarde, LW Martin, ...
Analytical chemistry 90 (5), 3475-3481, 2018
242018
Direct write of 3D nanoscale mesh objects with platinum precursor via focused helium ion beam induced deposition
A Belianinov, MJ Burch, A Ievlev, S Kim, MG Stanford, K Mahady, ...
Micromachines 11 (5), 527, 2020
222020
Helium ion microscopy for imaging and quantifying porosity at the nanoscale
MJ Burch, AV Ievlev, K Mahady, H Hysmith, PD Rack, A Belianinov, ...
Analytical chemistry 90 (2), 1370-1375, 2018
212018
Mapping 180 polar domains using electron backscatter diffraction and dynamical scattering simulations
MJ Burch, CM Fancher, S Patala, M De Graef, EC Dickey
Ultramicroscopy 173, 47-51, 2017
192017
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imaging
N Borodinov, A Belianinov, D Chang, JM Carrillo, MJ Burch, Y Xu, K Hong, ...
Nanoscale 10 (37), 18001-18009, 2018
172018
A novel work-flow to study Ir electrode thinning and dissolution in proton exchange membrane water electrolyzers
MJ Burch, KA Lewinski, MI Buckett, S Luopa, F Sun, EJ Olson, ...
Journal of Power Sources 500, 229978, 2021
162021
Realizing strain enhanced dielectric properties in BaTiO3 films by liquid phase assisted growth
DT Harris, MJ Burch, JF Ihlefeld, PG Lam, J Li, EC Dickey, JP Maria
Applied Physics Letters 103 (1), 2013
142013
Structures of partially fluorinated bottlebrush polymers in thin films
D Chang, M Lorenz, MJ Burch, OS Ovchinnikova, K Hong, BG Sumpter, ...
ACS Applied Polymer Materials 2 (2), 209-219, 2019
112019
Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopy
AV Ievlev, J Jakowski, MJ Burch, V Iberi, H Hysmith, DC Joy, BG Sumpter, ...
Nanoscale 9 (35), 12949-12956, 2017
102017
Ultra-high tunability in polycrystalline Ba1− xSrxTiO3 thin films
DT Harris, PG Lam, MJ Burch, J Li, BJ Rogers, EC Dickey, JP Maria
Applied Physics Letters 105 (7), 2014
102014
Mechanisms for microstructure enhancement in flux-assisted growth of barium titanate on sapphire
MJ Burch, J Li, DT Harris, JP Maria, EC Dickey
Journal of Materials Research 29, 843-848, 2014
102014
Low‐Temperature Control of Twins and Abnormal Grain Growth in BaTiO3
DT Harris, MJ Burch, J Li, EC Dickey, JP Maria
Journal of the American Ceramic Society 98 (8), 2381-2387, 2015
62015
Microstructure and dielectric properties with CuO additions to liquid phase sintered BaTiO3 thin films
DT Harris, MJ Burch, EJ Mily, EC Dickey, JP Maria
Journal of Materials Research 31, 1018-1026, 2016
52016
Chemical changes in layered ferroelectric semiconductors induced by helium ion beam
A Belianinov, MJ Burch, HE Hysmith, AV Ievlev, V Iberi, MA Susner, ...
Scientific Reports 7 (1), 16619, 2017
42017
Biofilm structure of Geobacter sulfurreducens by helium ion microscopy
A Belianinov, MC Halsted, MJ Burch, K Songkil, ST Retterer
Microscopy and Microanalysis 23 (S1), 1152-1153, 2017
22017
Domain structure of bulk and thin-film ferroelectrics by transmission Kikuchi diffraction
MJ Burch, DT Harris, CM Fancher, JP Maria, EC Dickey
Microscopy and Microanalysis 21 (S3), 777-778, 2015
22015
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論文 1–20