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Prof. Amitava Mukherjee
Prof. Amitava Mukherjee
XLRI - Xavier School of Management, Jamshedpur, India
Verified email at xlri.ac.in
Title
Cited by
Cited by
Year
A distribution‐free control chart for the joint monitoring of location and scale
A Mukherjee, S Chakraborti
Quality and Reliability Engineering International 28 (3), 335-352, 2012
1222012
A new distribution‐free control chart for joint monitoring of unknown location and scale parameters of continuous distributions
S Chowdhury, A Mukherjee, S Chakraborti
Quality and Reliability Engineering International 30 (2), 191-204, 2014
1162014
Distribution-free exponentially weighted moving average control charts for monitoring unknown location
MA Graham, A Mukherjee, S Chakraborti
Computational Statistics & Data Analysis 56 (8), 2539-2561, 2012
952012
Distribution‐free phase II CUSUM control chart for joint monitoring of location and scale
S Chowdhury, A Mukherjee, S Chakraborti
Quality and Reliability Engineering International 31 (1), 135-151, 2015
812015
Design and implementation of CUSUM exceedance control charts for unknown location
MA Graham, S Chakraborti, A Mukherjee
International Journal of Production Research 52 (18), 5546-5564, 2014
732014
Distribution-free exceedance CUSUM control charts for location
A Mukherjee, MA Graham, S Chakraborti
Communications in Statistics-Simulation and Computation 42 (5), 1153-1187, 2013
672013
A distribution-free phase-II CUSUM procedure for monitoring service quality
Mukherjee, Amitava, M Marozzi
Total Quality Management & Business Excellence 28 (11-12), 1227-1263, 2017
612017
Optimal design of Shewhart–Lepage type schemes and its application in monitoring service quality
A Mukherjee, R Sen
European Journal of Operational Research 266, 157-167, 2018
492018
Control Charts for Simultaneous Monitoring of Unknown Mean and Variance of Normally Distributed Processes
AK McCracken, S Chakraborti, A Mukherjee
Journal of Quality Technology 45 (4), 360-376, 2013
482013
Distribution-free Lepage Type Circular-grid Charts for Joint Monitoring of Location and Scale Parameters of a Process
A Mukherjee, M Marozzi
Quality and Reliability Engineering International 33 (2), 241-274, 2017
462017
Control charts for simultaneous monitoring of parameters of a shifted exponential distribution
A Mukherjee, AK McCracken, S Chakraborti
Journal of Quality Technology 47 (2), 176-192, 2015
462015
Editorial to the special issue: Nonparametric statistical process control charts
S Chakraborti, P Qiu, A Mukherjee
Quality and Reliability Engineering International 31 (1), 1-2, 2015
372015
Distribution-free Shewhart-Lepage type premier control schemes for simultaneous monitoring of location and scale
ZL Chong, A Mukherjee, MBC Khoo
Computers & Industrial Engineering 104, 201-215, 2017
362017
Nonparametric Phase-II control charts for monitoring high-dimensional processes with unknown parameters
A Mukherjee, M Marozzi
Journal of Quality Technology 54 (1), 44-64, 2022
332022
Some distribution-free Lepage-type schemes for simultaneous monitoring of one-sided shifts in location and scale
ZL Chong, M Amitava, MBC Khoo
Computers & Industrial Engineering 115, 653-669, 2018
312018
Comparisons of Shewhart-type rank based control charts for monitoring location parameters of univariate processes
A Mukherjee, R Sen
International Journal of Production Research 53 (14), 4414-4445, 2015
302015
A Distribution-free Phase I Monitoring Scheme for Subgroup Location and Scale based on the Multi-sample Lepage Statistic
C Li, A Mukherjee, Q Su
Computers & Industrial Engineering 129, 259-273, 2019
292019
Distribution-free phase-II exponentially weighted moving average schemes for joint monitoring of location and scale based on subgroup samples
A Mukherjee
International Journal of Advanced Manufacturing Technology 92 (1), 101-116, 2017
292017
Design and implementation issues for a class of distribution-free Phase II EWMA exceedance control charts
AM Graham, A Mukherjee, S Chakraborti
International Journal of Production Research 55 (8), 2397-2430, 2017
282017
Design and implementation of two CUSUM schemes for simultaneously monitoring the process mean and variance with unknown parameters
C Li, A Mukherjee, Q Su, M Xie
Quality and Reliability Engineering International 32 (8), 2961-2975, 2016
262016
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